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清华大学学报(自然科学版)  2022, Vol. 62 Issue (6): 1000-1009    DOI: 10.16511/j.cnki.qhdxxb.2022.22.034
  专刊:公共安全 本期目录 | 过刊浏览 | 高级检索 |
接触不良引发发光连接的动态变化
张晶1, 陈涛1, 黄丽达1, 苏国锋1,2, 孙占辉1, 陈建国1
1. 清华大学 工程物理系, 公共安全研究院, 北京 100084;
2. 清华大学 合肥公共安全研究院, 合肥 230601
Dynamics of glowing contacts triggered by poor electrical contact
ZHANG Jing1, CHEN Tao1, HUANG Lida1, SU Guofeng1,2, SUN Zhanhui1, CHEN Jianguo1
1. Institute of Public Safety Research, Department of Engineering Physics, Tsinghua University, Beijing 100084, China;
2. Hefei Institute for Public Safety Research, Tsinghua University, Hefei 230601, China
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摘要 接触不良引发的发光连接温度高、隐蔽性强、普遍产生于电气线路中,是诱发电气火灾的重要引燃热源之一,涉及铜氧化、传热、电场间的复杂耦合与相互作用。为探究发光连接产生过程中关键参数的动态变化,该文通过构建发光连接实验平台,测得铜氧化物桥生长速率、电阻增大速率和温度,揭示了铜氧化物、电阻和温度相互作用规律。实验结果表明:铜氧化物桥长度和电阻均随时间线性增大;温度先升高,最终稳定在1 400~1 600℃;随电流增大,铜氧化物桥生长速率增大,生长持续时间延长,电阻增大速率先增大后减小。接触不良引发发光连接是氧化程度加深、铜氧化物电阻率随电流改变、铜氧化物热容随温度变化等共同作用的结果。
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张晶
陈涛
黄丽达
苏国锋
孙占辉
陈建国
关键词 电气火灾接触不良发光连接铜氧化物    
Abstract:Glowing contacts triggered by poor electrical contact are one of the most important ignition sources for fires. The glowing contacts with high temperature are commonly hidden in electric wires. The glowing contact involves complex coupling between the copper oxidation, heat transfer, and electric field. The relationships between the key parameters are investigated experimentally by measuring the growth rate of the oxide bridge length as well as the glowing contact resistance and temperature. The results show that the oxide bridge length and the glowing contact resistance increase with time. The maximum contact temperature increases with time up to 1 400-1 600℃. Increasing currents increase the oxide bridge growth rate and growth time. The increasing rate of the resistance first increases and then decreases with the current increase. The results further show that the glowing contact is due to interactions between the oxidation extent, the changes in the copper oxide resistivity with the current, and the increases in the specific heat with temperature.
Key wordselectrical fire    poor electrical contact    glowing contact    copper oxide
收稿日期: 2022-02-16      出版日期: 2022-05-06
基金资助:应急管理部消防救援局科技计划项目(2020XFCX31)
通讯作者: 陈涛,研究员,E-mail:chentao.b@tsinghua.edu.cn      E-mail: chentao.b@tsinghua.edu.cn
作者简介: 张晶(1996-),女,博士研究生。
引用本文:   
张晶, 陈涛, 黄丽达, 苏国锋, 孙占辉, 陈建国. 接触不良引发发光连接的动态变化[J]. 清华大学学报(自然科学版), 2022, 62(6): 1000-1009.
ZHANG Jing, CHEN Tao, HUANG Lida, SU Guofeng, SUN Zhanhui, CHEN Jianguo. Dynamics of glowing contacts triggered by poor electrical contact. Journal of Tsinghua University(Science and Technology), 2022, 62(6): 1000-1009.
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http://jst.tsinghuajournals.com/CN/10.16511/j.cnki.qhdxxb.2022.22.034  或          http://jst.tsinghuajournals.com/CN/Y2022/V62/I6/1000
  
  
  
  
  
  
  
  
  
  
  
  
  
  
  
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