Abstract：The t-test is a hypothesis test that deals with two Gaussian samples with unknown variances. When the two samples have unequal variances and unequal sample sizes, the Welch t-test is more reliable than the Student's t-test. This paper evaluates the 1st order side-channel information leakage of 3DES with an AES type t-test. Welch t-tests suitable for evaluating 3DES are given with tests on three different devices that show this method is effective.
陈佳哲, 李贺鑫, 王亚楠, 王宇航. 运用t检验评估3DES算法的侧信道信息泄露[J]. 清华大学学报（自然科学版）, 2016, 56(5): 499-503.
CHEN Jiazhe, LI Hexin, WANG Yanan, WANG Yuhang. Evaluating side-channel information leakage in 3DES using the t-test. Journal of Tsinghua University(Science and Technology), 2016, 56(5): 499-503.
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