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Closed-loop temperature control system for a PEM during burn-in |
| BAI Bing, WANG Weiming, LI Qingfeng, LI Luming |
| Aerospace School, Tsinghua University, Beijing 100084, China |
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Abstract The plastic encapsulated microcircuits (PEM) burn-in method helps guarantee the reliability of PEM. Thermal runaway and uneven temperatures between different devices during burn-in are controlled by a closed-loop temperature control system. The control system adjusts the temperature of each burn-in socket relative to the oven temperature using a fuzzy adaptive algorithm to configure the control parameters of the PI controller that drives the heating or cooling actuators. The device temperature more quickly achieves steady state (20 min) with steady state errors of less than 1℃ and the temperature differences between the tested devices are reduced by 2℃ so that the temperature are almost the same with the closed-loop temperature control system. The fuzzy adaptive algorithm makes the system dynamic response much faster with stronger anti-interference ability. Thus, this system prevents thermal runaway and makes the temperatures equal between the different tested devices.
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| Keywords
plastic encapsulated microcircuits (PEM)
burn-in
reliability
closed-loop temperature controller
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Issue Date: 15 March 2016
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2016,
Vol. 56
