| SPECIAL SECTION: FAULT TOLERANT COMPUTING |
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Minimum run-changing point mark coding compression method |
| ZHAN Wenfa1,2, TAO Pengcheng1,2 |
1. School of Computer and Information, Anqing Normal University, Anqing 246003, China;
2. Key Laboratory of Intelligent Sensing and Computing in Anhui Province, Anqing 246003, China |
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Abstract Integrated circuit testing produces huge quantities of test data in expensive tests. This paper describes use of the minimum run-changing point mark coding compression method to compress the original test data to reduce the test costs. The method encodes the test set into several vectors and uses the overlapping relationships between the vector run range in each group to merge the run-length switching points. The run position in all the test vectors in the group can be represented by a vector which simplifies traditional coding compression. The method breaks through the limitation of using the suffix of the code word to express the length of the run, and greatly shortens the code word compared to conventional code compression. The method has simple decompression rules and low hardware overhead. Tests with the ISCAS 89 standard circuit experiment show that this compression scheme is more effective than other types of coding compression schemes.
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| Keywords
test data compression
lossless compression
coding
run
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Issue Date: 09 July 2020
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2020,
Vol. 60
