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Journal of Tsinghua University(Science and Technology)    2014, Vol. 54 Issue (2) : 202-206     DOI:
Orginal Article |
Improved resolution for SPR detection systems with angular modulation
Fuyin DOU,Peng WANG,Xinglong YU()
State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments, Tsinghua University, Beijing 100084, China
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Abstract  

Improved system resolutions for surface plasmon resonance (SPR) will enable applications in more fields. This paper shows theoretically that the resolution of SPR with angular modulation is not only improved with increased sensitivity, but also with a narrower half-peak width. The resolutions with Au, Ag and Au-Ag chips show that the resolution of the Au-Ag chip is higher than that of the Au chip. Thus, the system resolution can be improved by using the Au-Ag chip. Measurements of the resolution of Au and Au-Ag chips using NaCl solutions with different mass fractions show that the Au and Au-Ag chip resolutions are 5.2×10-6 and 3.9×10-6 RIU (refractive index unit). Thus, the Au-Ag chip resolution is 1.4 times higher than the Au chip, similar to the theoretical result being 1.6 times higher.

Keywords surface plasmon resonance (SPR)      system resolution      sensitivity      Au-Ag chip     
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Issue Date: 15 February 2014
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Fuyin DOU
Peng WANG
Xinglong YU
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Fuyin DOU,Peng WANG,Xinglong YU. Improved resolution for SPR detection systems with angular modulation[J]. Journal of Tsinghua University(Science and Technology), 2014, 54(2): 202-206.
URL:  
http://jst.tsinghuajournals.com/EN/     OR     http://jst.tsinghuajournals.com/EN/Y2014/V54/I2/202
  
  
  
  
dAg/nm,
dAu/nm
Sθ/((°)·RIU-1) Wθ/(°) σRI(归一化)
48,0 135 3.5 0.34
37,5 148 5.0 0.45
27,15 152 7.0 0.63
16,25 160 10.0 0.83
0,41 161 12.0 1.00
  
  
  
  
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