2014, Vol. 54(6): 811-814    DOI:
Rapid testing of the dynamic characteristics of MEMS gyroscope chips
Yan DENG1(),Chao XING1,2,Rong ZHANG1,Bin ZHOU1
1. State Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments, Tsinghua University, Beijing 100084, China
2. Unit 63888, PLA, Jiyuan 459000, China
Received 2013-10-08  Revised null
Supporting info