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Detect use-after-free vulnerabilities in binaries
HAN Xinhui, WEI Shuang, YE Jiayi, ZHANG Chao, YE Zhiyuan
Journal of Tsinghua University(Science and Technology) . 2017, (10): 1022 -1029 .  DOI: 10.16511/j.cnki.qhdxxb.2017.25.040

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