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清华大学学报(自然科学版)  2014, Vol. 54 Issue (2): 202-206    
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提高角度法SPR检测系统分辨率的方法
窦福印,王鹏,余兴龙()
 
Improved resolution for SPR detection systems with angular modulation
Fuyin DOU,Peng WANG,Xinglong YU()
State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments, Tsinghua University, Beijing 100084, China
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摘要 

提高表面等离子共振(surface plasmon resonance, SPR)检测系统的分辨率有利于扩大其应用。该文围绕角度检测方法,从理论上阐明了检测系统的分辨率不仅随着灵敏度的增强而改善,而且随着半峰宽的变窄而提高。同时,深入分析了使用金、银以及金银膜的分辨率,明确金银膜的分辨率比金膜高,提出采用金银膜的芯片来提高系统的分辨率。以不同质量分数的NaCl溶液为介质,分别测量使用金膜和金银膜时的分辨率。实验结果表明,金膜和金银膜各自对应的分辨率为5.2×10-6 RIU (refractive index unit)和 3.9×10-6 RIU, 后者较前者提高1.4倍,与理论分析结果1.6倍接近。

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窦福印
王鹏
余兴龙
关键词 表面等离子共振(SPR)系统分辨率灵敏度金银膜    
Abstract

Improved system resolutions for surface plasmon resonance (SPR) will enable applications in more fields. This paper shows theoretically that the resolution of SPR with angular modulation is not only improved with increased sensitivity, but also with a narrower half-peak width. The resolutions with Au, Ag and Au-Ag chips show that the resolution of the Au-Ag chip is higher than that of the Au chip. Thus, the system resolution can be improved by using the Au-Ag chip. Measurements of the resolution of Au and Au-Ag chips using NaCl solutions with different mass fractions show that the Au and Au-Ag chip resolutions are 5.2×10-6 and 3.9×10-6 RIU (refractive index unit). Thus, the Au-Ag chip resolution is 1.4 times higher than the Au chip, similar to the theoretical result being 1.6 times higher.

Key wordssurface plasmon resonance (SPR)    system resolution    sensitivity    Au-Ag chip
收稿日期: 2013-03-07      出版日期: 2015-04-16
ZTFLH:     
基金资助:国家自然科学基金资助项目 (30970757)
引用本文:   
窦福印, 王鹏, 余兴龙. 提高角度法SPR检测系统分辨率的方法[J]. 清华大学学报(自然科学版), 2014, 54(2): 202-206.
Fuyin DOU, Peng WANG, Xinglong YU. Improved resolution for SPR detection systems with angular modulation. Journal of Tsinghua University(Science and Technology), 2014, 54(2): 202-206.
链接本文:  
http://jst.tsinghuajournals.com/CN/  或          http://jst.tsinghuajournals.com/CN/Y2014/V54/I2/202
  不同金属膜的数值模拟ATR曲线
  灵敏度与εmRεs的关系
  某种复合膜的ATR曲线
  不同金属膜的谐振角与折射率线性拟合曲线
dAg/nm,
dAu/nm
Sθ/((°)·RIU-1) Wθ/(°) σRI(归一化)
48,0 135 3.5 0.34
37,5 148 5.0 0.45
27,15 152 7.0 0.63
16,25 160 10.0 0.83
0,41 161 12.0 1.00
  同一检测系统中不同金属膜所对应的分辨率
  测得的ATR曲线
  根据实验数据计算得到的测量基线
  测得谐振角与对应折射率的拟合曲线
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