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Characterization of short-circuit faults in energized conductors under varying thermal radiation intensities
Li MA, Xiaoqing YAN, Xiao HUANG, Gaoming WEI, Panpan LI
Journal of Tsinghua University(Science and Technology) . 2026, (4): 846 -857 .  DOI: 10.16511/j.cnki.qhdxxb.2026.27.015

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