[1] 陈田, 易鑫, 王伟, 等. 一种低功耗双重测试数据压缩方案[J]. 电子学报, 2017, 45(6):1382-1388.CHEN T, YI X, WANG W, et al. Low power multistage test data compression scheme[J]. Acta Electronica Sinica, 2017, 45(6):1382-1388. (in Chinese)
[2] XIANG D, CHAKRABARTY K, FUJIWARA H. Multicast-based testing and thermal-aware test scheduling for 3D ICs with a stacked network-on-chip[J]. IEEE Transactions on Computers, 2016, 65(9):2767-2779.
[3] LIANG H G, FANG X S, YI M X, et al. A novel BIST scheme for circuit aging measurement of aerospace chips[J]. Chinese Journal of Aeronautics, 2018, 31(7):1594-1601.
[4] YU T T, CUI A J, LI M Y, et al. A new decompressor with ordered parallel scan design for reduction of test data and test time[C]//2015 IEEE International Symposium on Circuits and Systems. Lisbon, Portugal:IEEE, 2015.
[5] 袁海英, 陈光, 谢永乐. 故障诊断中基于神经网络的特征提取方法研究[J]. 仪器仪表学报, 2007, 28(1):90-94.YUAN H Y, CHEN G J, XIE Y L. Feature extraction method in fault diagnosis based on neural network[J]. Chinese Journal of Scientific Instrument, 2007, 28(1):90-94. (in Chinese)
[6] 詹文法, 吴琼, 程一飞, 等. 嵌入广义折叠技术的集成电路测试数据压缩方案[J]. 计算机辅助设计与图形学学报, 2017, 29(8):1542-1548.ZHAN W F, WU Q, CHENG Y F. et al. Integrated circuit test data compression scheme built-in generalized folding technology[J]. Journal of Computer-Aided Design & Computer Graphics, 2017, 29(8):1542-1548. (in Chinese)
[7] 李光宇, 梁华国, 李扬, 等. 基于向量优化重组的LFSR重新播种方法[J]. 清华大学学报(自然科学版), 2011, 51(S1):1455-1459.LI G Y, LIANG H G, LI Y, et al. LFSR reseeding based on dividing and recombining of test cubes[J]. Journal of Tsinghua University (Science and Technology), 2011, 51(S1):1455-1459. (in Chinese)
[8] VOHRA H, SINGH A. Test data compression using hierarchical block merging technique[J]. Iet Computers & Digital Techniques, 2018, 12(4):176-185.
[9] RADHIKA K, GEETHA D M. Augmented recurrence hopping based run-length coding for test data compression applications[J]. Wireless Personal Communications, 2018, 102(4):3361-3374.
[10] CHANDRA A, CHAKRABARTY K. System-on-a-chip test-data compression and decompression architectures based on Golomb codes[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006, 20(3):355-368.
[11] CHANDRA A, CHAKRABARTY K. Test data compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes[J]. IEEE Transactions on Computers, 2003, 52(8):1076-1088.
[12] 邝继顺, 周颖波, 蔡烁. 一种用于测试数据压缩的自适应EFDR编码方法[J]. 电子与信息学报, 2015, 37(10):2529-2535.KUANG J S, ZHOU Y B, CAI S. Adaptive EFDR coding method for test data compression[J]. Journal of Electronics & Information Technology, 2015, 37(10):2529-2535. (in Chinese)
[13] 梁华国, 蒋翠云. 基于交替与连续长度码的有效测试数据压缩和解压[J]. 计算机学报, 2004, 27(4):548-554.LIANG H G, JIANG C Y. Efficient test data compression and decompression based on alternation and run length codes[J]. Chinese Journal of Computers, 2004, 27(4):548-554. (in Chinese)
[14] GONCIARI P T, AL-HASHIMI B M, NICOLICI N. Variable-length input Huffman coding for system-on-a-chip test[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2003, 22(6):783-796.
[15] TEHRANIPOOR M, NOURANI M, CHAKRABARTY K. Nine-coded compression technique for testing embedded cores in SoCs[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2005, 13(6):719-731.
[16] 韩银和, 李晓维, 徐勇军, 等. 应用Variable-Tail编码压缩的测试资源划分方法[J]. 电子学报, 2004, 32(8):1346-1350.HAN Y H, LI X W, XU Y J, et al. Test resource partitioning using variable-tail code[J]. Acta Electronica Sinica, 2004, 32(8):1346-1350. (in Chinese)
[17] 彭喜元, 俞洋. 基于变游程编码的测试数据压缩算法[J]. 电子学报, 2007, 35(2):197-201.PENG X Y, YU Y. A test set compression algorithm based on variable-run-length code[J]. Acta Electronica Sinica, 2007, 35(2):197-201. (in Chinese)
[18] RUAN X Y, KATTI R. An efficient data-independent technique for compressing test vectors in systems-on-a-chip[C]//IEEE Computer Society Annual Symposium on Emerging VLSI Technologies and Architectures. Karlsruhe, Germany:IEEE, 2006.
[19] 方建平, 郝跃, 刘红侠, 等. 应用混合游程编码的SOC测试数据压缩方法[J]. 电子学报, 2005, 33(11):1973-1977.FANG J P, HAO Y, LIU H X, et al. A hybrid run-length coding for SOC test data compression[J]. Acta Electronica Sinica, 2005, 33(11):1973-1977. (in Chinese)
[20] 梁华国, 蒋翠云, 罗强. 应用对称编码的测试数据压缩解压方法[J]. 计算机研究与发展, 2011, 48(12):2391-2399.LIANG H G, JIANG C Y, LUO Q. Test data compression and decompression using symmetry-variable codes[J]. Journal of Computer Research and Development, 2011, 48(12):2391-2399. (in Chinese)
[21] 程一飞, 詹文法. 一种双游程交替编码的测试数据压缩方法[J]. 计算机科学, 2014, 41(11):22-24, 55.CHENG Y F, ZHAN W F. Test data compression method of dual run length alternating coding[J]. Computer Science, 2014, 41(11):22-24, 55. (in Chinese)
